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Magnetron
![Scanning Probe Microscopes (SPM/AFM)](/global/en/media/no_image_tcm27-163222.png)
![Electron Microscopes (SEM/TEM/STEM)](/global/en/media/no_image_tcm27-163222.png)
![Focused Ion Beam Systems (FIB/FIB-SEM)](/global/en/media/no_image_tcm27-163222.png)
PRODUCT
Focused Ion Beam Systems (FIB/FIB-SEM)
Introduction of Focused Ion Beam Systems (FIB/FIB-SEM)
![Sample Preparation](/global/en/media/no_image_tcm27-163222.png)
![Process Gas Monitor](/global/en/media/cp1000_main_jpg_tcm27-31119.jpg)
PRODUCT
Process Gas Monitor
This system measures toxic components contained in gas in quite small quantity, small-quantity components adhered to material surfaces, etc., at high speed and high sensitivity.
![Dioxin Precursor /PCB Monitor CP-2000/CP-2000P](/global/en/media/cp2000_cp2000p_main_jpg_tcm27-31921.jpg)
PRODUCT
Dioxin Precursor /PCB Monitor CP-2000/CP-2000P
These monitors can measure and monitor the concentrations of chlorophenol and chlorobenzene contained in exhaust gas from garbage incinerator or the PCB concentration in PCB decomposing facilities continuously.