Skip to main content

Hitachi High-Tech
  1. Home
  2. Products & Services
  3. Electron Microscopes / Atomic Force Microscopes
  4. Electron Microscopes (SEM/TEM/STEM)
  5. Nano-probing System

Nano-probing System

Nanoscale Device Characteristics Analysis System Lineup

Nanoscale Device Characteristics Analysis System Nano-Prober NP8000

Nanoscale Device Characteristics Analysis System Nano-Prober NP8000

The Hitachi NP8000 is a SEM-based dedicated probing system designed to meet the analytical needs of 5 nm nodes and beyond. The system is capable of evaluating electrical characteristics, EBAC, EBIC, pulse IV, and the temperature requirements of nanoscale devices.

Related topics

S.I.navi

“S.I.navi” is Hitachi Membership Site for analytical instruments users.
“S.I.navi” provides helpful information for daily analysis.

Hitachi High-Tech Social Media