Nano-probing System
Nanoscale Device Characteristics Analysis System Lineup
Nanoscale Device Characteristics Analysis System Nano-Prober NP8000
The Hitachi NP8000 is a SEM-based dedicated probing system designed to meet the analytical needs of 5 nm nodes and beyond. The system is capable of evaluating electrical characteristics, EBAC, EBIC, pulse IV, and the temperature requirements of nanoscale devices.