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Nano-probing System

Nanoscale Device Characteristics Analysis System Lineup

Nanoscale Device Characteristics Analysis System Nano-Prober NP8000

Nanoscale Device Characteristics Analysis System Nano-Prober NP8000

The Hitachi NP8000 is a SEM-based dedicated probing system designed to meet the analytical needs of 5 nm nodes and beyond. The system is capable of evaluating electrical characteristics, EBAC, EBIC, pulse IV, and the temperature requirements of nanoscale devices.