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Microscopy & Microanalysis 2024 (M&M 2024)

Microscopy & Microanalysis 2024 (M&M 2024)

Join us at Microscopy & Microanalysis 2024 (M&M 2024) and discover the latest innovations and technologies Hitachi offers.

Whether you are currently manufacturing or developing next generation systems, you will learn about state-of-the-art equipment and analytical techniques designed specifically for the hydrogen production market and fuel cell manufacturing.

Booth Events at M&M 2024*

At M&M 2024, Hitachi High-Tech will offer a series of tutorials and presentations, including Lunch & Learn and Vendor Tutorial sessions. Do not miss this opportunity to learn about the latest technologies and innovation.

* Food & drink will be served. Limited capacity. First come, first served.

** Schedule and topics may change.

Monday, July 29th


Reserve your spot
Lunch Talk (12:00 PM Booth 214)
Introducing the New SU3900SE FE-SEM

Yuki Tani, SEM Application Engineer
DetailsHitachi High-Tech will be debuting the all-in-one Schottky SU3900/SU3800SE Series SEMs. These microscopes feature newly developed Schottky optics and a large chamber capable of accommodating large and heavy specimens, expanding the capabilities of your applications.

Reserve your spot
Tutorial (5:45 PM Booth 214)
New Approaches to Analytical STEM: Atomic Resolution EELS in a 30 kV SEM

Prof. Quentin Ramasse, Director, SuperSTEM
DetailsWe demonstrate how a Hitachi SU9000EA (T)SEM instrument equipped with a diffraction camera and an electron energy-loss spectrometer can be pushed towards atomic resolution mapping of materials such as complex oxides.

Other EELS applications will also be highlighted to further illustrate the versatility of these instruments, whose advanced capabilities as (T)SEM-EELS instruments belie their relative operational simplicity and low cost.

Tuesday, July 30th


Reserve your spot
Lunch Talk (12:00 PM Booth 214)
Advanced Measurement Automation with Hitachi Automated Materials Identification and Classification System (AMICS)

Jonathan P. Knapp, Ph.D, AMICS Product Manager & Program Director
DetailsJoin us for the launch of AMICS 3.3, the newest version of Hitachi’s Automated Material Identification and Classification System. This system, jointly developed with Bruker Nano Analytics, automates multi-modal data collection for quantitative large area phase mapping.

This demonstration will give an interlocution to the software, its workflow, and give several examples from various industries.

Reserve your spot
Tutorial (5:45 PM Booth 927 Advanced Microscopy Techniques)
Live Cryo-EM Screening at 100 kV Using Hitachi’s HT7800 Thermionic TEM

Heather Berensmann, Low-kV TEM Product Manager at Hitachi High-Tech America, Inc., Pushkarraj Deshmukh, Founder & President of Simple Origin Inc., and Adam Manganiello, Director of Sales & Marketing at AMT
DetailsJoin us for a real-time demonstration of the cryo-EM screening workflow for single particle analysis (SPA), covering sample transfer to image acquisition. This tutorial will showcase Hitachi’s newly developed retractable cold finger, designed for screening vitrified samples under cryogenic conditions with the HT7800 thermionic TEM. This innovative solution continues Hitachi’s aim towards versatility while providing greater accessibility to cryo-EM technology for everyone.

Wednesday, July 31st


Reserve your spot
Lunch Talk (12:00 PM Booth 214)
NEW - AI Deep Learning Solutions for Complex Image Analysis

Jeff Knipe, Product Manager and Tom Moyer, Sales Manager from Media Cybernetics
DetailsExplore a cutting-edge new software, Image-Pro AI, with seamless connection to Hitachi Electron Microscopes and leading AI Deep Learning segmentation and analysis. Experience solutions such as Metal Grain & Battery component analysis in the field of Material Analysis and TEM mitochondria and nuclei analysis in the field of Life Science. We will demonstrate a workflow that saves you time and frustration when working with complex images in either small or large numbers.

Reserve your spot
Tutorial (5:45 PM Booth 214)
The Vitro Detector – A Step Forward in Liquid Sample Imaging

Atsushi Muto, Assistant Manager and Application of SEM Products
DetailsIn this tutorial we will introduce Hitachi's recently developed Vitro Detector. The Vitro detector enables the observation of materials in a liquid state by utilizing their differences in dielectric constant (relative permittivity) as a signal source. This unique signal detection principle enables the observation of light elements and beam sensitive materials in their original state.

We are looking for collaborators to help develop new applications for this technology and encourage you to join us for the discussion.

Instruments Available for Demos

The following instruments will be available for private demos. Please reserve your spot in advance.

NEW!

SU3900SE FE-SEM

SU3900SE FE-SEM
Request a Demo


SU8700 UHR FE-SEM

SU8700 UHR FE-SEM
Request a Demo


HT7800 120 kV TEM

HT7800 120 kV TEM
Request a Demo

SU5000 Schottky FE-SEM

SU5000 Schottky FE-SEM
Request a Demo

TM4000II Tabletop SEM

TM4000II Tabletop SEM
Request a Demo

ArBlade5000 Cryo Ion Milling

ArBlade5000 Cryo Ion Milling
Request a Demo

Debuting at M&M: All-New SU3900SE FE-SEM

SU3900SE

[The new SU3800SE/SU3900SE FE-SEMs]

  • Wide-area observation of large/heavy specimens, up to 5 kg, 300 mm in diameter and 130 mm in height
  • Simple wide-area movement using optical camera images
  • Automated observation utilizing the optional recipe creator, EM Flow Creator

Private demos are available. Reserve your spot in advance!

Dates

July 29 – August 1, 2024

Location

Huntington Convention Center of Cleveland, Cleveland, OH

Contact

Hitachi High-Tech America

Event info and registration