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Hard Disks
![Compact ion beam etching machine](/global/en/media/ind_man_ion_001_main_png_tcm27-27713.png)
![Single wafer type ion beam etching machine](/global/en/media/ind_man_ion_002_main_png_tcm27-27720.png)
PRODUCT
Single wafer type ion beam etching machine
Product information of Single wafer type ion beam etching machine.
![Batch type ion beam etching machine](/global/en/media/ind_man_ion_003_main_png_tcm27-27739.png)
PRODUCT
Batch type ion beam etching machine
Product information of Batch type ion beam etching machine.
![Spin Processor (MSP-1)](/global/en/media/msp-1_main_jpg_tcm27-25643.jpg)
PRODUCT
Spin Processor (MSP-1)
This spin processor is suitable for R&D and small production. All processes from chemical process to dryer are in one cup.
![Multi Spin Processor (MSP-2)](/global/en/media/msp-2_main_jpg_tcm27-25651.jpg)
PRODUCT
Multi Spin Processor (MSP-2)
Multi spin processor is suitable for mass production and Multi complex process.
![Processing Machine for MEMS Device](/global/en/media/no_image_tcm27-163222.png)
![Batch Type Wet Station](/global/en/media/batch_main_jpg_tcm27-25634.jpg)
PRODUCT
Batch Type Wet Station
Our system has batch type cleaning ,resist stripping and etching potions. All processes from chemical cleaning to dryer are fully automated.
![Scanning Probe Microscopes (SPM/AFM)](/global/en/media/no_image_tcm27-163222.png)
![Electron Microscopes (SEM/TEM/STEM)](/global/en/media/no_image_tcm27-163222.png)
![Focused Ion Beam Systems (FIB/FIB-SEM)](/global/en/media/no_image_tcm27-163222.png)
PRODUCT
Focused Ion Beam Systems (FIB/FIB-SEM)
Introduction of Focused Ion Beam Systems (FIB/FIB-SEM)
![Sample Preparation](/global/en/media/no_image_tcm27-163222.png)
![Field Instruments/Analyzers](/global/en/media/no_image_tcm27-163222.png)
![Rail and Conductor Inspection Systems](/global/en/media/ind-rail_main3_jpg_tcm27-26592.jpg)
PRODUCT
Rail and Conductor Inspection Systems
A Full Lineup of Inspection Equipment That Supports Japan's World-Class Railroad Network. Our test equipment is used in the test cars of Japan's major railroad companies, including the test car for the Shinkansen bullet train. From car-mounted systems, to towed and manually-operated devices, our rail and contact wire inspection systems operate around the clock under regular operating speeds to ensure safety, reliability and a smooth ride.
![Disk Surface Inspection System NS7000 Series](/global/en/media/fpd_hd-ns7000_main_jpg_tcm27-31794.jpg)
PRODUCT
Disk Surface Inspection System NS7000 Series
A high-precision surface inspection system for substrate and disk featuring a sophisticated defect classification function by laser irradiation of multi dearing and newly developed incline defect method.
![Head Element Configuration Inspection Systems BM3100 Series](/global/en/media/fpd_hd-rh_main_jpg_tcm27-26671.jpg)
PRODUCT
Head Element Configuration Inspection Systems BM3100 Series
The BM3100 Series Head Tester is a powerful equipment that measures the width of the magnetic field of a magnetic recording head. Using a magnetic force microscope (MFM), it can measure the magnetic field width with high-resolution and performs the measurement in a non-destructive (non-contact) method under high-speed conveyance positioning and high speed. The high-speed, fully-automated equipment can support mass production.