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Search by Industry - Failure analysis

Failure analysis

Sample Preparation

PRODUCT

Sample Preparation

Introduction of Sample Preparation

Electron Microscopes (SEM/TEM/STEM)

PRODUCT

Electron Microscopes (SEM/TEM/STEM)

Introduction of Electron Microscopes (SEM/TEM/STEM)

Field Instruments/Analyzers

PRODUCT

Field Instruments/Analyzers

Introduction of Field Instruments/Analyzers

Scanning Probe Microscopes (SPM/AFM)

PRODUCT

Scanning Probe Microscopes (SPM/AFM)

Introduction of Scanning Probe Microscopes (SPM/AFM)

Focused Ion Beam Systems (FIB/FIB-SEM)

PRODUCT

Focused Ion Beam Systems (FIB/FIB-SEM)

Introduction of Focused Ion Beam Systems (FIB/FIB-SEM)

Power device Evaluation Equipment

PRODUCT

Power device Evaluation Equipment

Introduction of Power device Evaluation Equipment

Compact ion beam etching machine

PRODUCT

Compact ion beam etching machine

Product information of Compact ion beam etching machine.

Single wafer type ion beam etching machine

PRODUCT

Single wafer type ion beam etching machine

Product information of Single wafer type ion beam etching machine.

Batch type ion beam etching machine

PRODUCT

Batch type ion beam etching machine

Product information of Batch type ion beam etching machine.

Batch Type Wet Station

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Batch Type Wet Station

Our system has batch type cleaning ,resist stripping and etching potions. All processes from chemical cleaning to dryer are fully automated.

CD-SEM & Defect Inspection

PRODUCT

CD-SEM & Defect Inspection

Introduction of CD-SEM & Defect Inspection