[Dec 15-17, 2021: Tokyo, Japan] SEMICON Japan 2021

Invitation to the Hitachi High-Tech Group Booth

We are contributing to customers’ new value creation from R&D to mass production in leading-edge technology by utilizing the Hitachi High-Tech technologies; “Processing, Observation, Measurement, and Analysis” and we are working on customers’ business challenges solving by proposing “Integrated data solutions” which is realized by connecting and utilizing the Hitachi High-Tech technologies.

Products

• Conductor Etch System 9000 Series
• Conductor Etch System M-600/6000 Series

• Advanced Area Inspection SEM GS1000
• Wafer Surface Inspection System LS9300A
• Defect Review SEM CR7300
• Advanced CD Measurement SEM CS4800
• Defect and Pattern Evaluation SEM CT1000
• Mirror Electron Inspection System Mirelis VM1000
• Glass Plate Inspection System GI5400

• Advanced CD Measurement SEM CG7300
• Advanced High Voltage CD-SEM CV6300
• Design Based Metrology System

• Ultrahigh-Resolution Scanning Electron Microscope SU8600
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700
• Semiconductor Analysis by Electron Microscopes
• Tool Sustainable Solution
• Production Optimization Informatics (POI)

Support

A Job Fair for graduate and undergraduate students Semicon Tour, Seminar about the Industry, etc. It is held in an event site and online.

• https://www.semiconjapan.org/jp/programs/mirai-college

• For more information, please check SEMICON Japan 2021.

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