Schottky Field Emission Scanning Electron Microscope SU5000
![Schottky Field Emission Scanning Electron Microscope SU5000](/id/en/media/su5000_main_tcm39-56775.png)
Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination.
Overview
The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. Expert or novice, the result is now the same: Highest quality nano-scale images at everyone's fingertips!
Watch this 6-min video and see how the SU5000 and
EM Wizard work together!
![em-su5000 01](/id/en/media/su5000_01_jpg_tcm39-70867.jpg)
Features
- A novel, revolutionary user interface, EM Wizard, provides all users with optimum levels of resolution, repeatability, and throughput. With EM Wizard, beginners become experts overnight.
- Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand.
- A robust "draw-out" specimen chamber accommodates large specimens (-200 mmφ, -80 mmH).
- Rapid sample exchange with evacuation to observation in 3 minutes or less.
- Automated, intuitive on-demand image optimization on the fly.
- A visual and interactive guide offers 'pick and choose' SEM modes to ensure best operating conditions.
- With the 3D MultiFinder tool, samples are easily tilted and rotated with the image remaining centered and in focus.
![3D multi finder sum](/id/en/media/su5000_02_gif_tcm39-70868.gif)
and the image and field of view remain centered and in focus.
![selection E](/id/en/media/su5000_03_gif_tcm39-70869.gif)
EM Wizard optimizes the image for you.
Application data
Life Sciences
Frontal Cortex of Rat
![2 kV BSE image (thin section)](/id/en/media/su5000_ap01_tcm39-56778.png)
Specimen courtesy of Professor Kubota, NIPS, Japan
Rat Dorsal Root Ganglion Neuron
![5 kV SE image](/id/en/media/su5000_ap02_tcm39-56783.png)
Specimen courtesy of
Dr. Ushiki and Dr. Koga(*), Niigata University
*: Asahikawa Medical University
Materials Science
Multi-Walled Carbon Nanotube Outer Structure
![Acquired at 500 V of landing energy, Mag=200kX .](/id/en/media/su5000_ap03_tcm39-56806.png)
Neodymium Magnet
![2 kV, BSE images](/id/en/media/su5000_ap04_tcm39-56807.png)
Multiple angle information from a newly developed annular Backscatter Electron Detector (BSD) acquires both topographic and compositional information simultaneously.
Specimen courtesy of Daido Steel.
In-situ Imaging and the Use of a Heating Stage in the Specimen Chamber
![-](/id/en/media/su5000_ap05_tcm39-56808.png)
Specimen: Gold thin film on quartz substrate
HV=10 kV
Specimen courtesy of Dr. Yoshino and Dr. Terano, Tokyo institute of technology
3D analysis ; Lithium Ion Battery Material
![-](/id/en/media/su5000_ap07_tcm39-56810.png)
![-](/id/en/media/su5000_ap08_tcm39-56811.png)
3D re-constructed image of active material (orange) and PvdF (blue) distribution.
Semiconductors
Images of Atomic Step and Threading Dislocation of n-GaN on Si
![-](/id/en/media/su5000_ap09_tcm39-56812.png)
![-](/id/en/media/su5000_ap10_tcm39-56813.png)
Specimen courtesy of Professor Egawa,
Research Center for Nano-Device and System
Nagoya Institute of technology, Japan