Skip to main content

Hitachi High-Tech in India
  1. Home
  2. Products & Services
  3. Electron Microscopes / Atomic Force Microscopes
  4. Electron Microscopes (SEM/TEM/STEM)
  5. Tabletop Microscopes
  6. TM Series Energy Dispersive X-ray Spectrometer: Element series

TM Series Energy Dispersive X-ray Spectrometer: Element series

TM Series Energy Dispersive X-ray Spectrometer: Element series
Sample configuration in combination with a TM4000 series instrument

Advanced EDS features for tabletop SEM

Element series are EDX systems produced by EDAX Instruments. Si3N4 window SDD enhances the mapping speed and detection limits.

Features

Si3N4 Window

Si3N4 Window to optimize low energy X-ray transmission for light element analysis. Conventional detector window, there is improved mapping speed and detection limit.

Graph: High X-ray transmittance
High X-ray transmittance
figure: Extreme low energy detection
Extreme low energy detection
figure: Hexagonal support grid for increased transmission
Hexagonal support grid for increased transmission

APEX Software

  • Easy to Interpret Data
  • Multi user logins
  • User configurable windows
  • Customizable reporting
  • Simplified automation
  • Fast mapping
  • Collect/Review simultaneously
  • Spectrum Match Libraries
-

Contact Us