Application Notes: XRF Analysis
Read on for measurement examples of XRF Analysis.
XRF Analysis
Technical Reports
【XRF Analysis : EA1400】
| No. | Title | Product |
|---|---|---|
| XRF124 | Rapid Compositional Analysis of Zeolites by EA1400 | EA1400 |
| XRF114 | Analysis of Aluminum Alloy Samples by EA1400 | EA1400 |
| XRF113 | Component Analysis in Plating Coats Using Thin-film FP method | EA1400 |
| XRF112 | Analysis of precious metal alloys by EA1400 | EA1400 |
| XRF111 | Detection limits of RoHS target elements and P,Cl,Sn,Sb in various materials | EA1400 |
| XRF110 | Foreign matter analysis in food by EA1400 | EA1400 |
| XRF109 | Analysis of Slag with EA1400 | EA1400 |
【XRF Analysis : EA1000AIII】
| No. | Title | Product |
|---|---|---|
| XRF102 | Film thickness measurement off plated flim by EA1000AⅢ/VX | EA1000AⅢ,EA1000VX |
| XRF68 | Introduction of analysis line auto switching （Hazardous Substance Measurement Software Ver.2） | EA1000VX,EA1000AⅢ |
【XRF Analysis : Others】*Discontinued Products
| No. | Title | Product |
|---|---|---|
| XRF74 | Detection Limits of RoHS Elements and Cl, Sb, and Sn | SEA1000AⅡ,EA1200VX,EA6000VX |
| XRF73 | Simultaneous measurement of Cl, Sb, Sn, and RoHS Elements | SEA1000AⅡ,EA1200VX,EA6000VX |
| XRF69 | Enhanced Halogen Analysis Software | EA1000VX |
| XRF66 | Comparison of Detection Limits measured by Different Measurement Spot Sizes (2) | EA1000VX |
| XRF65 | Comparison of Detection Limits measured by Different Measurement Spot Sizes (1) | EA1000VX |
| XRF64 | Detection Limit of RoHS Restriction Substance | EA1000VX |
| XRF55 | Measurement for Controlling RoHS restricted 5 Elements and Sb | SEA1000AⅡ,EA1200VX,EA6000VX |
| XRF39 | Detection limit for elements in an aqueous liquor | EA1200VX |
Coating Thickness Measurement
Technical Reports
【Coating Thickness Gauge : FT160】
| No. | Title | Product |
|---|---|---|
| XRF120 | Thickness Analysis of Cu/Ni plating/Au plating FT160h | FT160Sh,160h,160Lh |
| XRF119 | Thickness Analysis of Cu/Ni plating/Au plating using FT160 | FT160S,160,160L |
| XRF118 | Thickness Analysis of Si wafer/Al plating using FT160h | FT160Sh,160h,160Lh |
| XRF117 | Thickness Analysis of Si wafer/Al plating using FT160h | FT160S,160,160L |
| XRF108 | Simultaneous determination of ENIG plating thickness and P concentrations by FT160 | FT160S,160,160L |
【Coating Thickness Gauge : FT110 series】
| No. | Title | Product |
|---|---|---|
| XRF99 | Film Thickness measurement of electroless nickel plating by FT110A | FT110 series |
| XRF95 | Analysis of Au film Thickness on Br-Containing PCB by FT110A | FT110 series |
| XRF80 | Repetitive accuracy improvement of Bi concentration in Sn-Bi solder plating | FT110 series |
| XRF58 | Measurement of Galvanization on Iron using FT110 Series | FT110 series |
【Coating Thickness Gauge : FT230】
| No. | Title | Product |
|---|---|---|
| XRF128 | Film Thickess Analysis of Ni/Sn Plating on Corson Copper by FT230 | FT230 |
| XRF127 | Film Thickess Analysis of Ni/Sn Plating on Phosphorus Bronze by FT230 | FT230 |
| XRF126 | Film Thickess Analysis of Ni/Sn Plating on Brassr by FT230 | FT230 |
| XRF125 | Film Thickess Analysis of Ni/Sn Plating on Copper by FT230 | FT230 |
| XRF123 | Film Thickess Analysis of Brass Connector Terminal Material by FT230 | FT230 |
| XRF122 | Thickess Analysis of Connector Terminal Material by FT230 | FT230 |
| XRF121 | Thickess Analysis of Plating Materials on Printed Circuit Boards by FT230 | FT230 |
【Coating Thickness Gauge : Others】*Discontinued Products
| No. | Title | Product |
|---|---|---|
| XRF91 | Analysis of electroless nickel plating thickness and phosphorus composition using the EA6000VX | EA6000VX |
| XRF85 | Electroless Nickel Plating Thickness Measurement and Phosphorus Analysis using FT150 | FT150 |
| XRF84 | Thickness Measurement of Au/Pd/Ni Multilayer plating using FT150 | FT150 |
| XRF83 | Measurement of Sn/Ni Layer in Ceramic Chip Component using FT150h | FT150h |
| XRF82 | XRF Analyzer FT150 －Software Overview－ | FT150 series |
| XRF81 | XRF Analyzer FT150 －Hardware Overview－ | FT150 series |
| XRF67 | Analysis of Electroless Nickel Plating Thickness and Elemental Composition | FT9500X,EA6000VX |
| XRF47 | FT9500X Application Note 3 | FT9500X |
| XRF40 | Coating thickness analysis of high polymer thin film | EA6000VX,FT9500 |
| XRF14 | Accurate measurement of very thin Au/Pd plating by FT9500 | FT9500 |
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