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Electronics Recycling

Polarized Zeeman Atomic Absorption Spectrophotometer ZA3000 Series

PRODUCT

Polarized Zeeman Atomic Absorption Spectrophotometer ZA3000 Series

Never Ending Evolution of Hitachi Zeeman Atomic Absorption Spectrophotometer ! ZA3000 series developed to meet user’s needs is a new elemental analysis instrument which employs the technology unachievable by other atomic absorption spectrophotometers so as to enhance the functionality and reliability while preserving the basic performance of the polarized Zeeman atomic absorption spectrophotometer, such as high accuracy and high sensitivity.

XRF Analysis

PRODUCT

XRF Analysis

Introduction of XRF Analysis

X-ray (XRF) Coating Thickness Gauge FT160 Series

PRODUCT

X-ray (XRF) Coating Thickness Gauge FT160 Series

Equipped with polycapillary X-ray focusing optics and a silicon drift detector, FT160 enables high preciseness and high throughput in nano-order level coating thickness measurement of electronic parts.

High Performance Liquid Chromatographs (HPLC) / Amino Acid Analyzers (AAA)

PRODUCT

High Performance Liquid Chromatographs (HPLC) / Amino Acid Analyzers (AAA)

Introduction of High Performance Liquid Chromatographs (HPLC) / Amino Acid Analyzers (AAA)

Mass Spectrometer

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Mass Spectrometer

Introduction of Mass Spectrometer

Thermal Analysis

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Thermal Analysis

Introduction of Thermal Analysis

Spectrophotometers (UV-Vis/NIR, FL)

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Spectrophotometers (UV-Vis/NIR, FL)

Introduction of Spectrophotometers (UV-Vis/NIR, FL)

LED Thermal Resistance Measuring Equipment

PRODUCT

LED Thermal Resistance Measuring Equipment

Introduction of LED Thermal Resistance Measuring Equipment

Scanning Probe Microscopes (SPM/AFM)

PRODUCT

Scanning Probe Microscopes (SPM/AFM)

Introduction of Scanning Probe Microscopes (SPM/AFM)

Electron Microscopes (SEM/TEM/STEM)

PRODUCT

Electron Microscopes (SEM/TEM/STEM)

Introduction of Electron Microscopes (SEM/TEM/STEM)

Focused Ion Beam Systems (FIB/FIB-SEM)

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Focused Ion Beam Systems (FIB/FIB-SEM)

Introduction of Focused Ion Beam Systems (FIB/FIB-SEM)

Sample Preparation

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Sample Preparation

Introduction of Sample Preparation

Fluorescent X-ray (XRF) Coating Thickness Gauge FT110A

PRODUCT

Fluorescent X-ray (XRF) Coating Thickness Gauge FT110A

The FT110A XRF Coating Thickness Gauge has a new auto focus function which automatically focuses on the sample to acquire optical image within a few seconds. No manual adjustment is required, which results in higher throughput.

HPLC OEM Solution

PRODUCT

HPLC OEM Solution

We offer you HPLC modules with outstanding performance, robust and easy-to-use. And we are flexible to customize modules upon your idea. If you are interested in it, feel free to contact us.

Field Instruments/Analyzers

PRODUCT

Field Instruments/Analyzers

Introduction of Field Instruments/Analyzers

Life Cycle Management Solution for Lithium-ion Batteries

PRODUCT

Life Cycle Management Solution for Lithium-ion Batteries

Introduction of Life Cycle Management Solution for Lithium-ion Batteries.