Vortex®-EZ Silicon Drift Detector
General Description
General Description - Vortex-EZ
Vortex-EZ silicon drift X-ray detectors feature active areas between 30 mm2 and 80 mm2. Vortex-EZ detectors are produced from high purity silicon using state-of-the-art CMOS production technology. They feature excellent energy resolution (<140 eV FWHM at Mn Kα is typical) and a high count rate capability. At a very short peaking time of 0.1 µs, an output count rate of 900 kcps is achieved. A unique feature of these detectors is their ability to process high count rates with very small loss in energy resolution and minimal peak shift with count rate.
Typical Applications
- X-ray fluorescence (XRF) spectroscopy both bulk and micro-fluorescence
- X-ray diffraction (XRD) and fluorescence (XRF)
- Partical Induced X-ray Emission (PIXE)
- Synchrotron radiation applications
- Process control
The Vortex-EZ is operated at near room temperature and cooled by a thermoelectric cooler (TEC) and can be cycled as frequently as needed without any degradation in detector performance. Cool down times are typically less than 2 minutes.
The Vortex-EZ X-ray spectroscopy system include a detector unit and control box which includes power supplies for the detector, TEC and an optional digital pulse processor with PI-SPEC Software.
The complete detector also contains a charge-sensitive preamplifier and temperature stabilization system, which eliminates concerns of varying ambient temperature.
Features
- Extended probe (60 mm)
- Available in 30, 40, 50, 65, 70, 80 mm2
- Available in thickness of 0.5 and 1 mm
- Superb energy resolution
- Detector temperature stabilization
- Additional sizes are available under special contracts
- Small and compact package for minimum vibration
- Digital pulse processor (DPP) with PI-SPEC Software
- RoHS Compliant
Specifications
| Name | Silicon Drift X-Ray Detector Spectrometer |
|---|---|
| Type | Vortex-EZ |
| Overview | Vortex-EZ silicon drift X-ray detectors feature active areas between 30 mm2 and 80 mm2. Vortex-EZ detectors are produced from high purity silicon using state-of-the-art CMOS production technology. They feature excellent energy resolution (<140 eV FWHM at Mn Kα is typical) and a high count rate capability. At a very short peaking time of 0.1 µs, an output count rate of 900 kcps is achieved. A unique feature of these detectors is their ability to process high count rates with very small loss in energy resolution and minimal peak shift with count rate. The Vortex-EZ is operated at near room temperature and cooled by a thermoelectric cooler (TEC) and can be cycled as frequently as needed without any degradation in detector performance. Cool down times are typically less than 2 minutes. The Vortex-EZ X-ray spectroscopy systems include a detector unit and control box which includes power supplies for the detector, TEC and an optional digital pulse processor with PI-SPEC Software. The complete detector also contains a charge-sensitive preamplifier and temperature stabilization system, which eliminates concerns of varying ambient temperature. |
| Typical Applications |
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| Features |
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| US Patent Number |
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Specifications
| Detector | Material – Silicon Active Area – 30-80 mm2 – Thickness – 0.5 mm and 1 mm |
|---|---|
| Window | Material – Beryllium Thickness – 12.5 and 25 µm (alternatives available) |
| Energy Resolution (FWHM) @ 5.9 keV | @ 1.0 µs Peaking Time 135 eV - 150 eV @ 0.5 µs Peaking Time 145 eV - 160 eV @ 0.25 µs Peaking Time 155 eV - 170 eV @ 0.1 µs Peaking Time 165 eV - 180 eV |
| Preamplifier | Type – Charge sensitive, 1.5 mV/keV Signal polarity – Positive Reset – Electrical, <1 µs duration Rise time – <100 ns |
| Cooling | Thermoelectric |
| Power Consumption | Nominal voltage – 110/230 V (switchable) Power supply and detector – 40 W Maximum |
| Physical Specifications | Detector package weight – 900 g Length – 227 mm (60 mm probe) Height × Width – 62 mm × 62 mm Cable Standard Length – 3 m |
| Digital Pulse Processor (DPP) | |
| Digital Controls | Gain – 16-Bit DAC Peaking Time – 0.25 - 16 µs Preset Time – Up to 1717s |
| Data Output | Spectrum Size – 1024, 2048 or 4096 channels Channel Size – 10, 20 or 40 eV |
| Integral Non-linearity | 0.1% of full-scale output |
| Deadtime Correction | Better than ± 0.5% accuracy from 0 to 120,000 cps at 4 µs peaking time |
| Software | PI-SPEC software* – Allows user to acquire, manipulate spectra. Pentium
III or later with at least 64 MB memory and 30 MB available disk space. VTXDLL package* – Dynamic-Link Library to facilitate host software communication with the DPP. Pentium III or later with at least 64 MB memory and 30 MB available disk space. |
* Requires a standard USB2.0 port
