Vortex®-ME3 Silicon Drift Detector
General Description
General Description - Vortex-ME3
Vortex-ME3 is a three-element silicon drift detector (SDD) X-ray detection system with a total active area of 90 mm2 - 150 mm2.
The Vortex-ME3 offers superior energy resolution and high throughput performance to enhance the total analytical performance of the X-ray spectrometry system.
The Vortex-ME3 is a special focal design, for maximizing solid angle, and with a narrow rectangular snout, to allow insertion and operation in a chamber with limited space. The focal distance can be designed per the customer’s request.
Typical Applications
- X-ray fluorescence (XRF) spectroscopy both bulk and micro-fluorescence
- Synchrotron radiation applications
- Process control
- Fast X-ray mapping
- TEM and SEM applications where a horizontal geometry is applied
The Vortex-ME3 is operated at near room temperature and cooled by a thermoelectric cooler (TEC) and can be cycled as frequently as needed without any degradation in detector performance. Cool down times are typically less than 3 minutes.
The Vortex-ME3 X-ray spectroscopy systems include a detector unit and control box which includes power supplies for the detector, TEC and an optional digital pulse processor.
The complete detector also contains charge-sensitive preamplifiers and temperature stabilization system, which eliminates concerns of varying ambient temperature.
Features
- Extended probe (300 mm - 600 mm)
- Available in thickness of 0.5, 1, and 2 mm
- Large area, three-element silicon drift detector (90 mm2 - 150 mm2)
- 0.5 mm thick, 50 mm2 SQUARE sensor
- Excellent energy resolution
- Three SDDs in a focal design; vertical or horizontal configuration
- Detector temperature stabilization
- Additional sizes are available under special arrangements
- Small and compact package helps minimize vibration
- Xmap or Mercury 4 - multi element processor
- Equipped with an ion pump
- RoHS Compliant
Specifications
| Name | Silicon Drift X-Ray Detector |
|---|---|
| Type | Vortex-ME3 |
| Overview | Vortex-ME3 is a three-element, focal design, silicon drift detector (SDD) X-ray detection system feature active areas of up to 150 mm². The Vortex-ME3 offers superior energy resolution and high throughput performance to enhance the total analytical performance of the X-ray spectrometry system. The Vortex-ME3 is a special focal design, which maximizes solid angle, and features a narrow rectangular snout, to allow insertion and operation in a chamber with limited space. The focal distance can be designed per the customer's request. The Vortex-ME3 (Model number 1044-VTX-ME3-700) is composed of the following components, which are supplied as a package:
|
| Component Specifications | Detector material: Silicon Detector sensitive thickness: 0.5, 1, and 2 mm Detector total active area (for 3 SDDs) 90 mm² - 150 mm² Window material: 12.5 µm thick Beryllium, or ATW (Moxtek MP3) Preamplifiers 1 per SDD for a total of 3): Type: Charge sensitive Gain: 1.5 mV/keV +/-10% Signal polarity: Positive Reset: Electrical, synchronized for all channels, <1 µs duration Cooling: Air cooling. Sufficient airflow needed. Do not obstruct cooling fan vent. |
| Spectrometer Performance (each channel) using the Xmap | Energy resolution using 55Fe isotope: FWHM (eV) at 5.9 keV Peaking Time 1µs Typical <145 eV Maximum 155 eV, Peaking Time 0.5 µs Typical < 150 eV Maximum 170 eV, Peaking Time 0.25 µs Typical < 165 eV Maximum 185 eV, Peaking Time 0.1 µs Typical < 220 eV Maximum 260 eV Output count rate (OCR) of each channel at 50% dead time, with optimum pileup rejection performance, measured with X-ray tube excitation of a Mn sample: Peaking Time 1 µs 0.5 µs 0.25 µs 0.1 µs OCR (kcps) per Channel >130 >250 >400 >700 Mcps Peak-to-background ratio (peak count at 5.9 keV divided by average counts between 1.6 keV and 3.2 keV background using 55Fe): >1000:1 at 1 µs peaking time where background measured as an average counts between 1.6 – 3.2 keV. Counting efficiency stability for 8 hours using 55Fe isotope: <+/-0.5% rms Counting efficiency stability with temperature (+5 to +30°C) using 55Fe: <200ppm/°C Peak position stability with temperature (+5 to +30 °C) using 55Fe: <20eVat 200kcps ICR |
Operating Environment
| Ambient Temperature | +5 to +30 °C |
|---|---|
| Humidity | 20 to 80% RH (no condensation) |
| Operating Position | Horizontal, or tilted from 0 – 90° with the detector end pointing down |
| Physical Specifications | Length × Height × Width: 900 mm × 325 mm x 125 mm Weight: 4.3kg Standard Cable length: 3 m |
| 4-channel digital pulse processor (Xmap from XIA) | Digitization: 14 bit, 50 MHz Gain: 16 bit, Gain DAC control Peaking Time: 0.1 – 100 µs Pileup rejection: Pulse pair resolution (PPR) better than 100ns ROIs: Up to 32 ROIs can be defined Timing: Multiple spectra, or ROIs can be stored with continuous operation using dual memory bank configuration. Integral non-linearity: <=0.1% over the full scale output range |
| Data output | Spectrum size: 1024, 2048, 4096, 8192 Channel size: 10 eV |
| Software | xManager (from XIA) |
| Power Requirement and Consumption | Inlet line voltage (Inlet key selectable): 100V+15%, 115V+15%, 230V+20% single phase Detector power consumption: <40 W Xmap unit power consumption: <20 W |
| Ion Pump | Requires power, when the system is OFF or in storage, to maintain vacuum. |
* 8 µm Be window available for a max SDD open area of 30 mm2
* 12.5 µm Be window available for a max SDD open area of 50 mm2
* 25 µm Be window available for a max SDD open area of 100 mm2
* 1mm thick SDD available for all SDD sizes, but final open area is smaller as a result of collimation
