MirrorCLEM System for Correlative Light and Electron Microscopy
MirrorCLEM, a simple solution for correlative light and electron microscopy (CLEM).
Overview
MirrorCLEM is designed to simplify the correlation of specimens between optical and electron microscopes. With this novel system, specimens can be observed under any optical microscope to obtain light/fluorescent image information and then be easily coordinated to our SEM stage whereby high-resolution EM data can be acquired at the same location. This correlation technique utilizes the optical image(s) as an anchor map thereby automatically driving the SEM stage to desired locations by simply clicking on a region of interest (ROI). Additionally, MirrorCLEM is capable of displaying a real-time overlay of the optical and EM images for efficient and high precision data acquisition.
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Information on our new cold field emitter technology can be found here.
Hitachi FE-SEM Application Data
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.
Photo collections of beauty of metals, minerals, organisms etc. reproduced by the electron microscope and finished more beautifully by computer graphic technology.
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