Principle of SPM, AFM
Principle of SPM, AFM
Scanning Probe Microscope (SPM) represents a particular family of advanced microscopy techniques that allow the simultaneous measurements of surface topography as well as a wide variety of material properties at nanometer scale.
The two key members in this family are Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM).
SPM Measurement Mode
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