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  3. Electron Microscopes/Atomic Force Microscopes
  4. Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)
  5. Principle of SPM, AFM
  6. Scanning Tunneling Microscope (STM)

Scanning Tunneling Microscope (STM)

A tunnel current flowing between probe and sample is detected (controlled so that the tunnel current is fixed and sample surface is scanned) by applying a bias voltage between a metallic probe and conductive or semiconductive sample as the distance between them approaches less than several nm. Sample topography as well as its electronic state are observed.

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Image of graphite atoms
Scan area: 1.3 nm

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