Atomic Force Microscope (AFM) / Contac Mode
For contact mode AFM, the force between probe and sample is detected and measured via cantilever’s deflection. A feedback system will maintain this deflection constant while scanning the sample surface to observe topography.
![-](/global/en/media/afm_01_jpg_tcm27-23263.jpg)
![Semiconductor circuit](/global/en/media/afm_02_jpg_tcm27-23264.jpg)
![Langmuir‐Blodgett film](/global/en/media/afm_03_gif_tcm27-23265.gif)
Animation of AFM Observation: Langmuir‐Blodgett film