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Scanning Probe Microscopes (SPM/AFM)

The deciding factor for introducing the AFM5300E was the environmental control

Yoshimichi Namai (Lead researcher, Ph.D. (Science) Analysis Unit, Material Properties Research Laboratory Mitsui Chemical Analysis & Consulting Service, Inc.)

The high performance you need to become an expert user.
We love being able to focus on the actual measurements.

Shingo KANEHIRA (Microwave Chemical Co., Ltd. Researcher Ph.D.(Engineering))

Product comparison

Product name
Basic functions
Function expandability*
Applicable environments
Fine positioning mechanism for samples
Sample sizes
AFM100 series
Multifunctional Probe Microscopy Platform
(AFM100):AFM, DFM, PM, FFM, SIS-shapes
(AFM100 Plus):AFM, DFM, PM, FFM, SIS-shapes/properties, Q-value control
SIS-ACCESS, LM-FFM, VE-AFM, Adhesion, MFM, EFM, KFM, PRM, Nano/Pico-Current, SSRM, Pico-STM*(AFM100 Plus only)
Atmosphere, in liquid*, Heated*(*RT - 250°C), heated in liquid (RT -60°C)
Manual stage XY: ±2.5 mm
Impact stage (conductive type)
Maximum 35 mm diam., thickness 10 mm
(max. 50 mm sq., thickness 20 mm)*
AFM5500M
Mid-sized Probe Microscope System
AFM, DFM, PM Phase, FFM
SIS topography, SIS material properties, LM-FFM, VE-AFM, Adhesion, Current, Pico-Current, SSRM, PRM, KFM, EFM(AC), EFM(DC), MFM
Atmosphere
Precise motor-driven stage
Observable region: Entire 100 mm (4 inches)
Stroke: Y ± 50 mm, Z ≥21 mm
Minimum Step: XY 2 μm, Z 0.04 μm
Maximum 100 mm diam, thickness 20 mm
AFM5300E
Environmental control unit
AFM, DFM, PM, FFM
SIS, STM, LM-FFM, VE-AFM, Adhesion, Current, SSRM, SNDM, PRM, KFM, EFM, MFM
Ambient, vacuum*, submerged in liquid*, Humidity*
Heating and cooling*
(-120 - 300°C /RT - 800°C)
Manual stage
XY: ±2.5 mm
Maximum 25 mm diam., thickness 10 mm

*Optional

This section introduces applications (actual measurement cases) for scanning probe microscopes (SPM/AFM).

Information for product users

This section offers information aimed at customers who use our scanning probe microscopes.

For first-time users

Related topics

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